Allegro XP™ High Throughput Large MLCC Testing System
Allegro XP™ High Throughput Large MLCC Testing System
Test the latest-generation larger-size chips at ultra-high throughput while minimizing damage.
- Verify quality and ensure accurate MLCC specifications
- Tests larger part sizes ranging from 0603-1210 (1608-3225 metric)
- Productivity rates of up to one million chips per hour See All Features
Features
Low-impact ultra high-speed processing from a market leader in MLCC testing
Allegro XP™ delivers the levels of precision demanded by leading MLCC manufacturers producing larger and higher-voltage chips for applications in industries such as automotive, IoT, handheld devices and commercial communication equipment.
Up To One Million Parts Per Hour
Incorporating ESI-pioneered technologies, Allegro XP reliably performs high-throughput production-level electrical testing of the latest-generation high-voltage chips at rates of up to one million parts per hour: the highest testing throughput in the industry.
Low-impact Rotary Chip Handling Technology
Our low-impact rotary chip handling technology maintains throughput while minimizing testing-related chip damage. Patented pulse-actuated contacts minimize termination marking and maintain contact integrity. Allegro XP also accommodates up to 25 test stations simultaneously performing multiple tests, with ease-of-configuration allowing for fast change-over to various production-run testing setups.
Precision in motion, designed for flexibility
- Testing for Higher-Voltage Applications up to 1kV
- Ultra High-Speed Processing at rates of up to 16,666 parts per minute (1,000,000 parts per hour)
- Tests chip sizes of 0603-1210 (1608-3225 metric)
- Addresses the Full Range of Capacitance: 120 Hz/1 kHz & 1 MHz
- Improved motion, tooling and handling
- Supports up to eight active stations
This latest addition to ESI’s Allegro family provides the flexibility and reliability MLCC manufacturers need to test a wide range of chip sizes at the full range of capacitance. Allegro XP delivers an exceptionally low cost of ownership, consistently high throughput and higher testing yield.
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